The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Mar. 04, 2015
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/263 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2635 (2013.01); G06F 11/3034 (2013.01); G06F 11/36 (2013.01); G06F 11/3668 (2013.01); G06F 11/3414 (2013.01); G06F 11/3664 (2013.01);
Abstract
Metadata of a target data record set population is used to generate a test data record set population for use in data storage system testing. The metadata includes values for metadata parameters for individual target data record sets. The target data record set population as a whole has metadata parameter values distributed among sets of value ranges. A group of proportions is calculated for each set of value ranges. A test data record set population is generated based on the groups of proportions. As generated, the test data record set population meets a set of predetermined criteria.