The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Aug. 03, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Display Technology Co., Ltd, Beijing, CN;
Fengwu Yu, Beijing, CN;
Jinhu Cao, Beijing, CN;
Minghui Ma, Beijing, CN;
Bin Cao, Beijing, CN;
Namin Kwon, Beijing, CN;
Yanyan Wu, Beijing, CN;
Wei Li, Beijing, CN;
Mian Gao, Beijing, CN;
Long Guo, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE DISPLAY TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present application discloses a display panel test structure for testing whether signal lines of a display panel are defective, the signal lines at least comprising a plurality of data lines which are divided into N groups, the display panel test structure comprising N first shorting bars arranged in a test area of the display panel, each of which being configured to short-circuit a group of data lines, wherein the display panel test structure further comprises a plurality of first test pads arranged in the test area, each of which connects with one shorting bar corresponding thereto, and each of the first test pads is configured to load a signal to a group of data lines corresponding thereto during a test.