The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Sep. 04, 2013
Applicant:

Ingrain, Inc., Houston, TX (US);

Inventors:

Mehdi Matt Honarpour, Houston, TX (US);

Jack Dvorkin, Houston, TX (US);

Assignee:

Ingrain, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/10 (2006.01); G01V 5/08 (2006.01); G01V 5/12 (2006.01); G01V 5/04 (2006.01); G01V 11/00 (2006.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01V 5/12 (2013.01); G01N 23/046 (2013.01); G01V 5/04 (2013.01); G01V 11/00 (2013.01);
Abstract

A method is provided for evaluating a geological formation which integrates well data and high resolution computed tomography of rock samples thereof. Relationships are determined for a formation between a formation property, such as an elastic property, and at least one of photoelectric effect index (PEF), effective atomic number (Z), and bulk density (RHOB), using well data, and tomographic imaging is used to determine at least one of the latter mentioned properties (PEF, Z, RHOB) at higher resolution, which can be used in the relationship to determine a corresponding formation property. This affords an opportunity to develop formation property data for more challenging formations to evaluate, such as thinly laminated formations or others. Computerized systems, computer program products on non-transitory computer usable storage media, and programs for performing the methods are also provided.


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