The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Feb. 20, 2015
Apple Inc., Cupertino, CA (US);
Micah P. Kalscheur, San Francisco, CA (US);
Jawad Nawasra, Mountain View, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A light beam scanning device includes a controller device which dynamically adjusts a divergence of the beam. Divergence adjustment can include adjusting the beam divergence along one or more cross sectional axes of the beam. Beam divergence can be adjusted between consecutive scans, during a scan, etc. Beam divergence can be adjusted based on the field of view and scan rate. Beam divergence adjustment can enable dynamic adjustment of the spot size of the beam, which can enable the apparatus to adjust between scanning a wide divergence beam to detect objects in a scene and scanning a narrow divergence beam to generate detailed point clouds of the detected objects. Beam divergence adjustment can enable adjustment of reflection point intensity, enabling detection of low-reflectivity objects.