The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Nov. 17, 2014
King Yuan Electronics Co., Ltd., Hsinchu, TW;
Fu-Tai Chen, Hsinchu, TW;
KING YUAN ELECTRONICS CO., LTD., Hsinchu, TW;
Abstract
A comparison device for comparing test pattern files of a wafer tester includes a storage unit and a processing unit. The comparison device stores a first to-be-compared file and a second to-be-compared file into the storage unit. The processing unit reads the first to-be-compared file and the second to-be-compared file from the storage unit to process and executes comparison operation, so as to generate a comparison result. The comparison operation compares the words in a first section of the first to-be-compared file with the words in a second section of the second to-be-compared file in a one-to-one manner, wherein, if the first section ending point is not the end of the first to-be-compared file or the second section ending point is not the end of the second to-be-compared file, the processing unit resets the first section and the second section, and executes comparison operation again.