The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Dec. 16, 2014
Panduit Corp., Tinley Park, IL (US);
Rachel M. Bugaris, Lexington, KY (US);
John C. Senese, Naperville, IL (US);
Craig T. Hoeppner, Bolingbrook, IL (US);
James E. Fabiszak, Darien, IL (US);
Richard A. Rago, New Lenox, IL (US);
Masud Bolouri-Saransar, Orland Park, IL (US);
Ronald A. Nordin, Naperville, IL (US);
Nekheel S. Gajjar, Chicago, IL (US);
Panduit Corp., Tinley Park, IL (US);
Abstract
A system for testing electrical continuity of a device to a source wherein there is at least one conductor connecting the device to the source can include a reference capacitive load, an oscillator, and a microprocessor. The oscillator is selectively connected to the reference capacitive load and each conductor connecting the device to the source such that the frequency output of the oscillator is a function of the selected capacitive load of the oscillator. Each conductor connecting the device to the source is connected to the oscillator such that when each one is selectively connected, the output of the oscillator is a function of that conductor's parasitic self-capacitance. The microprocessor can then compare the frequency of the signal generated when each conductor is connected to the oscillator with the frequency of the signal generated when the reference capacitive load is connected.