The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Nov. 01, 2017
Applicant:

Dnt Scientific Research, Llc, San Diego, CA (US);

Inventors:

Naishu Wang, Poway, CA (US);

Michael Chang Chien, Cerritos, CA (US);

Jiwei Ying, Poway, CA (US);

Assignee:

DNT SCIENTIFIC RESEARCH, LLC, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/22 (2006.01); G01N 33/543 (2006.01); C12Q 1/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54386 (2013.01); C12Q 1/00 (2013.01);
Abstract

A test device uses driven flow technology in a simplified testing format, such as dip format, to provide a rapid diagnostic test device that shortens the interpretation time of the test result to less than one minute and minimizes manufacturing costs. The test device shortens the distance between the opening on the front side housing and the conjugate pad without squeezing the sample pad and without requiring a separate component, such as a cap, to squeeze the sample pad. The test device utilizes a single, integral housing made from, for example, a flexible transparent material, such as polyethylene terephthalate (PET) that integrates the traditional base and top, or inner and outer tubes, into one to save the manufacturing costs.


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