The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Jul. 17, 2014
Seiko Epson Corporation, Tokyo, JP;
Yoshifumi Arai, Matsumoto, JP;
Hikaru Kurasawa, Fujimi-machi, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
A calibration curve creating method includes: (a) acquiring observation data of a plurality of samples of a test object; (b) acquiring content of a target component of each sample; (c) estimating a plurality of independent components when the observation data of each sample is separated into the plurality of independent components, and acquiring a mixing coefficient corresponding to the target component for each sample; and (d) acquiring a regression equation of a calibration curve. (c) includes acquiring an independent component matrix by performing a first preprocessing including normalization of the observation data, a second preprocessing including whitening, and an independent component analysis process in this order. β divergence is used as an independence index of the independent component analysis process, and a robust regression method is used in (d).