The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Oct. 11, 2013
GE Sensing & Inspection Technologies Gmbh, Hürth, DE;
Dieter Lingenberg, Hürth, DE;
General Electric Company, Schenectady, NY (US);
Abstract
A method and a device for the non-destructive inspection of a rotationally symmetric workpiece having sections with different diameters by a non-destructive inspection technique, such as ultrasound, are provided. Within the context of the method, a test data set characterizing the material properties of the workpiece is generated by the inspection technique. An azimuth angle-dependent indicated value set is generated therefrom. Subsequently, a representation of the workpiece is generated, wherein the elements of the indicated value set are depicted in the representation in a spatially resolved manner. In particular, a graphic representation of the surface of the workpiece can be generated in which flaw signals are displayed that may have been found.