The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Jan. 02, 2014
Applicants:
The Nottingham Trent University, Nottingham, GB;
Cranfield University, Cranfield, GB;
Inventors:
Paul Evans, Nottingham, GB;
Keith Rogers, Swindon, GB;
Assignees:
The Nottingham Trent University, Nottingham, GB;
Cranfield University, Cranfield, GB;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01); G01N 23/205 (2018.01); G01N 23/04 (2018.01); H04N 5/232 (2006.01); H04N 5/32 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2055 (2013.01); G01N 23/046 (2013.01); G01N 23/20008 (2013.01); G01N 23/20083 (2013.01); H04N 5/23293 (2013.01); H04N 5/32 (2013.01); G01N 2223/419 (2013.01); G01N 2223/64 (2013.01);
Abstract
A sample () is irradiated with electromagnetic radiation such as X-Rays and diffraction data is sampled at inner and outer caustic rims formed at a sensor surface () and defined by a continuum of Debye cones () formed by diffraction of the incident radiation. Intensities of the inner and outer rims while translating and rotating the sample are converted using a tomographic technique into X-ray diffraction images and material discrimination is also possible.