The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Jan. 03, 2014
Applicant:

Bell Helicopter Textron Inc., Fort Worth, TX (US);

Inventors:

Jeffrey P. Nissen, Fort Worth, TX (US);

Edward Hohman, Arlington, TX (US);

Assignee:

Bell Helicopter Textron Inc., Fort Worth, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01); G01M 13/02 (2006.01); G01N 21/91 (2006.01); G01N 21/95 (2006.01); G01N 27/84 (2006.01); G01N 21/952 (2006.01); B64F 5/60 (2017.01);
U.S. Cl.
CPC ...
G01M 17/00 (2013.01); G01M 13/02 (2013.01); G01N 21/91 (2013.01); G01N 21/9515 (2013.01); B64F 5/60 (2017.01); F05D 2220/329 (2013.01); F05D 2260/4031 (2013.01); F05D 2260/80 (2013.01); F05D 2270/8041 (2013.01); G01N 21/952 (2013.01); G01N 27/84 (2013.01);
Abstract

A system and method to inspect flaws associated with a part. The system includes a first image capturing device configured to capture a first set of images of the part and a computer operably associated with first image capturing device and configured to receive and analyze the first set of images. The method includes treating the part with a magnetic particle and fluorescent penetrant processing, capturing a first set of images of an outer surface of the part with the first image capturing device, and identifying a part defect with an algorithm associated with the computer.


Find Patent Forward Citations

Loading…