The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Apr. 02, 2012
Kentaro Fukuda, Shunan, JP;
Noriaki Kawaguchi, Shunan, JP;
Akira Yoshikawa, Sendai, JP;
Takayuki Yanagida, Sendai, JP;
Yui Yokota, Sendai, JP;
Kentaro Fukuda, Shunan, JP;
Noriaki Kawaguchi, Shunan, JP;
Akira Yoshikawa, Sendai, JP;
Takayuki Yanagida, Sendai, JP;
Yui Yokota, Sendai, JP;
TOKUYAMA CORPORATION, Shunan-Shi, JP;
TOHOKU UNIVERSITY, Sendai-Shi, JP;
Abstract
The present invention aims at providing a scintillator for high temperature environments which has satisfactory light emission characteristics under high temperature environments; and a method for measuring radiation under high temperature environments. The scintillator for high temperature environments comprises a colquiriite-type crystal represented by the chemical formula LiMMX(where Mis at least one alkaline earth metal element selected from Mg, Ca, Sr and Ba, Mis at least one metal element selected from Al, Ga and Sc, and X is at least one halogen element selected from F, Cl, Br and I), for example, typified by LiCaAlF, and the crystal optionally containing a lanthanoid element such as Ce or Eu. The method for measuring radiation under high temperature environments uses the scintillator.