The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

May. 14, 2015
Applicant:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Inventors:

Harihar Narasimha-Iyer, Livermore, CA (US);

Scott A. Meyer, Livermore, CA (US);

Assignee:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/15 (2006.01); A61B 3/113 (2006.01); A61B 3/10 (2006.01); A61B 3/117 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61B 3/102 (2013.01); A61B 3/113 (2013.01); A61B 3/117 (2013.01); A61B 3/12 (2013.01);
Abstract

Systems and methods for improving ophthalmic imaging by correlating the location of a measurement on the pupil of the eye with a quality of the measurement and further controlling subsequent measurements based on the quality are presented. Aspects of the invention include obtaining optical coherence tomography (OCT) measurements through cataracts or other media opacities, obtaining B-scans with minimized tilt, and automated OCT data acquisition of select structures in the eye. Embodiments of the invention directed towards imaging tissues with angle dependent layer contrast and mapping the size and location of cataracts in the eye are also described.


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