The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Aug. 21, 2017
Seiko Epson Corporation, Tokyo, JP;
Ryuichi Shiohara, Nagano, JP;
Tatsuya Ichikawa, Nagano, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A method of measuring a display delay time includes a step where a display pattern displayed on a first display including i (i is a natural number greater than 2) display elements is switched to a display pattern other than the display pattern at every elapse of a pattern continuation time, and j (j is a natural number, 1<j<i) display elements brought into a first display state is switched at every elapse, a step where an image of the display pattern on the first display is captured, a step where the captured image is displayed on a second display, and a step where the display delay time from capturing the image on the first display to displaying the image on the second display is measured based on a difference between the display pattern on the first display and the display pattern on the second display.