The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Mar. 07, 2014
Fotonation Cayman Limited, San Jose, CA (US);
Kartik Venkataraman, San Jose, CA (US);
Florian Ciurea, San Jose, CA (US);
FotoNation Cayman Limited, San Jose, CA (US);
Abstract
Systems and methods for measuring scene information while capturing images using array cameras in accordance with embodiments of the invention are disclosed. In one embodiment, a method of measuring scene information while capturing an image using an array camera includes defining at least two subsets of active cameras, configuring the active cameras using image capture settings, capturing image data using the active cameras, synthesizing at least one image using image data captured by a first subset of active cameras, measuring scene information using image data captured by a second subset of active cameras, and determining whether the image capture settings satisfy at least one predetermined criterion for at least one image capture parameter using the measured scene information, where new image capture settings are determined and utilized to configure the active cameras upon a determination that the image capture settings do not satisfy the at least one predetermined criterion.