The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Apr. 27, 2016
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Kunzhi Yu, Palo Alto, CA (US);

Cheng Li, Palo Alto, CA (US);

Marco Fiorentino, Palo Alto, CA (US);

Raymond G. Beausoleil, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 1/00 (2006.01); H04L 27/22 (2006.01); H04L 27/233 (2006.01); H04L 25/06 (2006.01);
U.S. Cl.
CPC ...
H04L 27/223 (2013.01); H04L 27/2338 (2013.01); H04L 25/066 (2013.01); H04L 25/069 (2013.01);
Abstract

In one example, an apparatus includes an offset tunable edge slicer having an input to receive a pulse amplitude modulation signal. The offset tunable edge slicer also has a plurality of possible offset settings corresponding to a plurality of different reference voltages of the offset tunable edge slicer. A multiplexer has an output coupled to the input of the offset tunable edge slicer and an input to receive a control signal that selects one of the plurality of possible offset settings for the offset tunable edge slicer. A phase detector has an input coupled to an output of the offset tunable edge slicer.


Find Patent Forward Citations

Yu, Kunzhi. (2018). Offset tunable edge slicer for sampling phase amplitude modulation signals (U.S. Patent No. 9917713). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9917713

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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