The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Aug. 09, 2016
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Hiroshi Takatori, Sacramento, CA (US);
Kevin Zheng, Alhambra, CA (US);
Zhan Duan, Milpitas, CA (US);
Assignee:
Futurewei Technologies, Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/38 (2015.01); H04B 17/21 (2015.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 17/11 (2015.01);
Abstract
An apparatus, system, and method are provided for configuring a serializer/deserializer (SerDes) based on evaluation of a probe signal. Included is circuitry configured to detect at least one of a probe signal or a reflection resulting from the probe signal. Such probe signal and/or reflection is evaluated such that at least one configurable aspect of the apparatus may be set, based on the evaluation.