The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Dec. 16, 2015
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Shoichiro Oda, Fuchu, JP;
Yasuhiko Aoki, Yokohama, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An optical signal quality monitoring apparatus includes: a holding unit configured to hold a relational expression representing a relationship among an optical signal intensity, a noise intensity, and an optical signal-to-noise ratio and a plurality of calibration coefficients used in the relational expression; a measurement unit configured to measure an optical power of input light and a noise power in the input light; an arithmetic unit configured to calculate a plurality of optical signal-to-noise ratios, based on the optical power and the noise power measured by the measurement unit, by using the relational expression and the plurality of calibration coefficients; and a determination unit configured to select one optical signal-to-noise ratio from the plurality of optical signal-to-noise ratios, based on a magnitude relationship of the plurality of optical signal-to-noise ratios calculated by the arithmetic unit.