The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Dec. 09, 2014
Olympus Corporation, Tokyo, JP;
Yamato Kanda, Hino, JP;
Makoto Kitamura, Hachioji, JP;
Takashi Kono, Tachikawa, JP;
Masashi Hirota, Hachioji, JP;
Toshiya Kamiyama, Hachioji, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An image processing apparatus includes: an imaging distance estimating unit configured to estimate an imaging distance to a subject shown in an image; an examination region setting unit configured to set an examination region in the image such that an index indicating a spread of a distribution of imaging distances to the subject shown in the examination region is within a given range; and an abnormal structure identifying unit configured to identify whether or not a microstructure of the subject shown in the examination region is abnormal, by using texture feature data that enables identification of an abnormality in the microstructure of the subject shown in the examination region, the texture feature data being specified according the examination region.