The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Mar. 21, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Masahiro Matsushita, Yokohama, JP;

Hirotaka Shiiyama, Yokohama, JP;

Hideki Sorakado, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/36 (2006.01); G06T 3/00 (2006.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06K 9/00201 (2013.01); G06K 2009/363 (2013.01); G06K 2209/01 (2013.01); G06T 3/0093 (2013.01); G06T 7/50 (2017.01);
Abstract

A feature point is extracted from an input image including an image region for which depth values of pixels change consecutively. A transformation that normalizes depth values of pixels of a vicinity of the feature point with respect to a region of at least a portion of the input image is set as a normalization transformation, and an image for a feature amount calculation is generated by performing the normalization transformation on a pixel position of the feature point. A feature amount is calculated from the image for the feature amount calculation.


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