The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Mar. 20, 2015
Applicant:

Nec Corporation, Minato-ku, Tokyo, JP;

Inventor:

Akihiro Hayasaka, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/73 (2017.01); G06T 7/593 (2017.01); G06K 9/52 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06K 9/00281 (2013.01); G06K 9/00208 (2013.01); G06K 9/00288 (2013.01); G06K 9/52 (2013.01); G06T 7/593 (2017.01); G06T 7/74 (2017.01); G06T 19/20 (2013.01); G06T 2200/04 (2013.01); G06T 2219/2016 (2013.01);
Abstract

A face comparison device according to the present invention includes: an occluded-feature point estimation unit that estimates an occluded-feature point that is a feature point of an invisible face, and outputs position information of the occluded-feature point; a pseudo-feature point estimation unit that estimates a pseudo-feature point that is an erroneously detected feature point not captured within the input image due to occlusion, and outputs position information of the pseudo-feature point; and a comparison unit that generates a normalized image of the input image by using the position information of the occluded-feature point and the pseudo-feature point, generates a normalized image of an acquired comparison image, and compares the first facial feature vector extracted from the normalized image of the input image and the second facial feature vector extracted from the generated normalized image of the comparison image.


Find Patent Forward Citations

Hayasaka, Akihiro. (2018). Face comparison device, method, and recording medium (U.S. Patent No. 9916495). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9916495

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…