The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Mar. 20, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Robert J. Baseman, Brewster, NY (US);

Amit Dhurandhar, Yorktown Heights, NY (US);

Fateh A. Tipu, Wappingers Falls, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 2219/32187 (2013.01); G05B 2219/45031 (2013.01); Y02P 90/22 (2015.11);
Abstract

A method, a computer program product, and a computer system for identifying significant and consumable-insensitive trace features. A computer computes a residual in a first regression of one or more secondary factors on a target. The computer computes residuals in a second regression of the one or more secondary factors on each of one or more trace features in one or more trace feature sets. The computer computes, for the one or more trace feature sets, coefficients of determination in a third regression of the residuals in the second regression on the residual in the first regression. The computer ranks the one or more trace feature sets by sorting the coefficient of determination. The computer determines, based on rankings of the one or more trace feature sets, significant trace feature sets.


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