The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Dec. 08, 2015
Fiber inspection microscope and power measurement system, fiber inspection tip and method using same
Exfo Inc., Quebec, CA;
Robert Baribault, Quebec, CA;
EXFO INC., Quebec, CA;
Abstract
The fiber inspection microscope and power measurement system for inspecting an endface of an optical fiber at an angle-polished connector generally has: a mating interface for receiving the angle-polished connector, the endface causing a mean propagation direction of light exiting the optical fiber at endface to be tilted relative to an imaging path of the system; a converging element to be optically coupled to the endface and being configured to receive the tilted light and to redirect the tilted light toward the imaging path of the fiber inspection microscope system; and a power detection assembly optically coupled to the converging element, the power detection assembly being configured to detect an optical power associated with the tilted light redirected by the converging element.