The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Oct. 23, 2014
Honeywell International Inc., Morristown, NJ (US);
Joseph E. Scheitlin, Plymouth, MN (US);
Mats Anders Brenner, Plymouth, MN (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
Systems and methods for averaging satellite sigmas and readmitting excluded satellite measurements into differential corrections and integrity monitors are provided. In one embodiment, a method comprises: calculating a first RFI based averaged sigma and a second RFI based averaged sigma, wherein the first RFI based averaged sigma includes a sigma for the excluded satellite measurement and wherein the second RFI based averaged sigma does not include the sigma for the excluded satellite measurement; and, readmitting the excluded satellite measurement into either a differential correction broadcast or a respective integrity monitor when the first RFI based averaged sigma is less than or equal to the second RFI based averaged sigma.