The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Sep. 30, 2014
Siemens Aktiengesellschaft, Munich, DE;
David Grodzki, Erlangen, DE;
Wilfried Landschuetz, Baiersdorf, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method for the determination of sensitivity profiles of local coils in the acquisition of magnetic resonance data, a first measurement data set of an examination area is acquired with a first acquisition coil, a second measurement data set of the examination area is acquired with a local coil, and a sensitivity profile of the local coil that is used is determined on the basis of the first measurement data set and the measurement data set. The first measurement data set and the second measurement data set are acquired using a pulse sequence with ultrashort echo times. In the determination of the sensitivity profile, errors due to dephasings are avoided as best as possible by the acquisition of the measurement data sets with a pulse sequence with ultrashort echo times (i.e. in particular echo times TE shorter than 0.5 ms); in particular, the dephasings are smaller given these echo times than in the case of gradient echo (GRE)-based pulse sequences.