The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Apr. 16, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Heiko Meyer, Uttenreuth, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 15/02 (2006.01); G01R 33/54 (2006.01); A61B 5/055 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/543 (2013.01); A61B 5/055 (2013.01); A61B 5/72 (2013.01); G05B 15/02 (2013.01);
Abstract

In a method and magnetic resonance apparatus for establishing at least one measurement protocol of a magnetic resonance measurement of an examination object, the measurement parameters necessary for the magnetic resonance measurement of the examination object are set, at least one absorption variable according to the measurement parameters set is established, and at least one measurement protocol is established that includes further measurement parameters according to the established at least one absorption variable. A characteristic variable can be established that indicates the ability to carry out the at least one measurement protocol according to the at least one established absorption variable.


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