The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Feb. 06, 2017
International Business Machines Corporation, Armonk, NY (US);
Michael Fee, Cold Spring, NY (US);
Ronald J. Frishmuth, Poughkeepsie, NY (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Cedric Lichtenau, Stuttgart, DE;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Aspects include techniques for bypassing an encoded latch on a chip during a test-pattern scan and using on-chip circuitry to generate a desired encoded pattern, which is inserted into a scan-bypassed latch, to test the on-chip circuitry for defects. A computer-implemented method may include applying a global control bit to the chip; initializing a scan of the chip while bypassing the encoded latch; and applying an extra scan clock to initiate the encoded latch after completing the scan, wherein the encoded latch is updated with check bits generated by the on-chip circuitry.