The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Apr. 06, 2016
Fbs, Inc., Bellefonte, PA (US);
Steven E. Owens, Bellefonte, PA (US);
Cody J. Borigo, Port Matilda, PA (US);
Li Zhang, State College, PA (US);
Joseph L. Rose, State College, PA (US);
Russell G. Love, Port Matilda, PA (US);
FBS, INC., Bellefonte, PA (US);
Abstract
A system for non-destructive inspection of a structure includes a magnetostrictive pulser coil and a ferromagnetic strip. The ferromagnetic strip is coupled to the structure adjacent to the pulser coil. A scanner receiver probe is located adjacent to the ferromagnetic strip. The probe includes a probe body, a position encoder, and a magnetostrictive partial loading receiver coil. A magnet applies a biasing magnetic field to the ferromagnetic strip. A pulser system generates a time-varying current in the pulser coil to induce a time-varying magnetization in the ferromagnetic strip to generate guided wave energy in the structure. The probe detects reflected guided wave energy as the probe is moved around the circumference of the structure. A processor controls the pulser system, records guided wave reflections, and process the guided wave and probe position data to generate a one-dimensional image or a two-dimensional image of anomalies in said structure.