The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Mar. 17, 2017
Applicant:
Sumitomo Rubber Industries, Ltd., Kobe-shi, Hyogo, JP;
Inventors:
Fusae Kaneko, Kobe, JP;
Hiroyuki Kishimoto, Kobe, JP;
Assignee:
SUMITOMO RUBBER INDUSTRIES, LTD., Kobe-Shi, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/06 (2018.01); G01N 23/083 (2018.01); G01N 33/44 (2006.01);
U.S. Cl.
CPC ...
G01N 23/063 (2013.01); G01N 23/083 (2013.01); G01N 33/445 (2013.01); G01N 2223/60 (2013.01);
Abstract
The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.