The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Apr. 22, 2015
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Kazushi Uno, Atsugi, JP;
Fumio Takei, Isehara, JP;
Takeo Kasajima, Machida, JP;
Kyoko Tadaki, Atsugi, JP;
Minoru Ishinabe, Atsugi, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An abnormality detection system includes an optical fiber, a Raman scattered light detection unit, and a data processing unit. The detection unit is configured to detect Stokes light and anti-Stokes light which are generated in the optical fiber and to output data on the intensity distribution of the Stokes light in the optical fiber in the length direction thereof and data on the intensity distribution of the anti-Stokes light in the optical fiber in the length direction. The processing unit is configured to calculate the product of a value obtained by applying an FIR filter to the intensity distribution of the Stokes light, and a value obtained by applying the FIR filter to the intensity distribution of the anti-Stokes light for each of locations on the optical fiber in the length direction, and to determine whether or not abnormality is present based on the result of the calculation.