The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2018

Filed:

Dec. 26, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Marcaurele Brun, Tokyo, JP;

Kazumasa Sato, Tokyo, JP;

Shinji Omori, Chiba, JP;

Yoichi Katsumoto, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 27/22 (2006.01); G01N 33/487 (2006.01); G01N 15/12 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1031 (2013.01); G01N 15/1218 (2013.01); G01N 27/221 (2013.01); G01N 33/48728 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1037 (2013.01); G01N 2015/1081 (2013.01); G01N 2015/1087 (2013.01); G01N 2015/129 (2013.01); G01N 2015/1254 (2013.01);
Abstract

There is provided a microparticle analysis apparatus including a sample channel configured to receive liquid containing a plurality of microparticles, a first pair of electrodes configured to form an alternating electric field in at least a part of the sample channel, a measuring part configured to measure impedance between the first pair of electrodes, an analyzing part configured to calculate property values of the microparticles from the impedance measured in the measuring part, and a determining part configured to determine whether data of the impedance measured in the measuring part is derived from the microparticles.


Find Patent Forward Citations

Loading…