The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Mar. 07, 2016
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Christopher D. Prest, Cupertino, CA (US);
Matthew S. Scott, San Jose, CA (US);
Stephen P. Zadesky, Cupertino, CA (US);
Dermot J. Stratton, Cupertino, CA (US);
Joseph C. Poole, Cupertino, CA (US);
Theodore A. Waniuk, Cupertino, CA (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02B 1/24 (2006.01); G01L 1/22 (2006.01); H03K 17/965 (2006.01);
U.S. Cl.
CPC ...
G01L 1/22 (2013.01); H03K 17/965 (2013.01); H01H 2211/032 (2013.01); H03K 2217/9651 (2013.01); H03K 2217/96062 (2013.01); Y10T 307/786 (2015.04);
Abstract
Pressure sensing systems comprising bulk-solidifying amorphous alloys and pressure-sensitive switches containing bulk-solidifying amorphous alloys. The bulk-solidifying amorphous alloys are capable of repeated deformation upon application of pressure, and change their electrical resistivity upon deformation, thereby enabling measurement of the change in resistivity and consequently, measuring the deformation and amount of pressure applied.