The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Feb. 28, 2013
Applicant:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Inventors:
Tomy Varghese, Madison, WI (US);
Atul Nishikant Ingle, Madison, WI (US);
Assignee:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/08 (2006.01); G01S 15/89 (2006.01); G01S 7/52 (2006.01); A61B 18/14 (2006.01); A61B 17/00 (2006.01); A61B 18/00 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/4461 (2013.01); A61B 8/4494 (2013.01); A61B 18/1477 (2013.01); G01S 7/52042 (2013.01); G01S 15/894 (2013.01); G01S 15/8918 (2013.01); G01S 15/8925 (2013.01); G01S 15/8979 (2013.01); G01S 15/8993 (2013.01); A61B 8/0841 (2013.01); A61B 8/483 (2013.01); A61B 2017/0011 (2013.01); A61B 2018/0088 (2013.01); A61B 2090/378 (2016.02);
Abstract
High-speed three-dimensional reconstruction of elasticity data is obtained by acquiring a sparse set of data in planes sharing a common axis line and angularly arrayed about the axis line. The axis line may be an RF ablation probe and the reconstruction may enforce a circumferential smoothness in the reconstruction about the probe, as is compatible with an ablation volume.