The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2018
Filed:
Jul. 02, 2013
Orsense Ltd., Petah Tikva, IL;
Aharon Weinstein, Ramat HaSharon, IL;
Yosef Gandelman, Ashdod, IL;
ORSENSE LTD., Petah Tikva, IL;
Abstract
The present invention provides techniques for measuring one or more parameters of a subject using a probe having an optical assembly configured and operable for applying optical measurements to a measurement location in a subject and generating optical measured data indicative thereof comprising at least one of pulsatile and occlusion measurements, a pressure system configured and operable for controllably applying pressure to the subject in the vicinity of the measurement location and measuring pressure inside the pressure system and generating pressure data indicative thereof, and a control system configured and operable for receiving and processing the pressure data to identify whether the optical measured data is valid, and for processing the valid optical measured data and determining at least one relation between the valid optical measured data and the corresponding pressure data indicative of at least one parameter of the subject.