The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Mar. 18, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hyoung Min Park, Seoul, KR;
Kyoung Gu Woo, Seoul, KR;
Jung Hoe Kim, Seongnam-si, KR;
Baek Hwan Cho, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Disclosed are an image sampling apparatus and method. The image sampling apparatus includes a probe angular velocity detector configured to detect an angular velocity of a probe representing a change in an angle of the probe at a surface of an object, an image segmenter configured to receive the angular velocity and an image captured by the probe, and to segment the image into sub-regions based on the angular velocity, and a differential sampler configured to sample the sub-regions with a different sampling rate based on a position of a sub-region.