The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Apr. 11, 2016
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Jian Zhou, Buffalo Grove, IL (US);
Wenli Wang, Briarcliff Manor, NY (US);
Yi Fan, Chicago, IL (US);
Zhou Yu, Wilmette, IL (US);
TOSHIBA MEDICAL SYSTEMS CORPORATION, Otawara-shi, JP;
Abstract
A method and apparatus is provided to predict a regularization parameter for regularized iterative reconstruction of radiation detection data (e.g., computed tomography (CT) data or positron-emission tomography (PET) data) to generate a reconstructed image having specified statistical properties. The predicted regularization parameter is determined using a root-finding method performed on a transcendental objective function. The objective function is calculated using a three-dimensional Fourier transforms of an approximation to a shift invariant Hessian matrix and of matrix products between the forward-projection and back projection matrices of the system model and various (statistical) weight matrices. The specified statistical properties can include the standard deviation within a region of interest, a local spatial resolution, a low-contrast-detectability metric, etc. In addition to the specified statistical properties, the prediction of the regularization parameter accounts for the statistical properties of the radiation detection data, the display field of view, and the system model.