The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Jul. 27, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Koshi Hatakeyama, Tokyo, JP;

Norihito Hiasa, Utsunomiya, JP;

Kaoru Eguchi, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/20 (2006.01); H04N 5/357 (2011.01); H04N 5/232 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 5/003 (2013.01); H04N 5/23296 (2013.01); H04N 5/3572 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10052 (2013.01);
Abstract

An image processing method includes the steps of acquiring a first image shot by using a compound eye image pickup apparatus, acquiring image capturing condition information of the first image, acquiring, depending on the image capturing condition information, optical characteristic information of a plurality of optical systems having a plurality of focal lengths different from each other in the compound eye image pickup apparatus, correcting a deterioration of the first image caused by shooting the first image based on the optical characteristic information, and generating a second image based on information of a position and an angle of a ray obtained from the first image whose deterioration is corrected, and the optical characteristic information contains at least one of information related to aberrations and information related to peripheral illumination of the optical systems.


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