The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Aug. 29, 2011
Applicant:

Masashi Koga, Tokyo, JP;

Inventor:

Masashi Koga, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/00 (2006.01); G01B 11/03 (2006.01); G06T 11/60 (2006.01); H04W 4/04 (2009.01);
U.S. Cl.
CPC ...
G06K 9/00671 (2013.01); G01B 11/00 (2013.01); G01B 11/03 (2013.01); G06T 11/60 (2013.01); H04W 4/043 (2013.01);
Abstract

A monitoring device monitors facility elements in a building. Self-localization of the monitoring device is estimated by collating measured three-dimensional shapes with a map for localization including the shapes and positions of structural objects inside a building excluding the shapes and positions of facility elements. The monitoring device extracts the shape and position of a facility element candidate from the measured three-dimensional shapes; and calculates a similarity between the shape and position of each of the facility elements in the periphery of the self-localization extracted from the facility element collation map. The monitoring device identifies which of the facility elements in the periphery of the self-localization extracted from the facility element collation map is the facility element candidate extracted from the measured three-dimensional shape on the basis of the calculated similarity.


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