The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Mar. 11, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Walter D. Alvey, San Jose, CA (US);

Ronald J. Barber, San Jose, CA (US);

Yi Ding, Beijing, CN;

Chandrasekaran Mohan, Saratoga, CA (US);

Steven R. Pearson, Portland, OR (US);

Richard S. Sidle, Mountain View, CA (US);

Adam J. Storm, Toronto, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30315 (2013.01); G06F 17/30339 (2013.01); G06F 17/30477 (2013.01);
Abstract

According to one embodiment of the present invention, a method for processing a query in a column database is provided. The method for analyzing test results may include a computer, associating a first set of metadata values with a set of records in a table, wherein each record has an associated state indicated by a metadata value. The method may further include the computer receiving a query to return one or more records of the set of records. The method may further include the computer determining that one or more records in the set of records satisfies the query. The method may further include the computer determining whether at least a first record in the one or more records that satisfies the query is in a returnable state based, at least in part, on the metadata value.


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