The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Jul. 23, 2015
Kabushiki Kaisha Toshiba, Minato-Ku, JP;
Naoto Kume, Yokohama, JP;
Kei Takakura, Yokohama, JP;
Hidehiko Kuroda, Yokohama, JP;
Yukio Yoshimura, Yokohama, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
Abstract
An alpha ray observation device and an alpha ray observation method are provided that can correctly evaluate a signal derived from alpha rays. The alpha ray observation device according to an embodiment includes a device housing, an incident window, a condenser, an optical path changer, and a first optical detector. The device housingis provided with an opening. The incident windowis provided at the opening, and can block beta rays. Emitted light originated by alpha rays caused from the measurement object set outside of the device housingenters the inside of the device housingthrough the incident windowwith beta rays being blocked, and is condensed by the condenser, and the optical path is changed by the optical path changer, and subsequently the light is detected by the first optical detector. The first optical detectoroutputs a signal according to the amount of detected light.