The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Sep. 02, 2014
Seiko Epson Corporation, Tokyo, JP;
Ryoki Watanabe, Nagano, JP;
Masaki Hayashi, Nagano, JP;
Kazuyuki Kano, Alchi, JP;
Kenji Murakami, Nagano, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
Provided are an ultrasonic measurement apparatus, an ultrasonic imaging apparatus and an ultrasonic measurement method that achieve an increase in processing speed together with an increase in resolution and are user friendly. An image is generated by adding together, with a weight having a fixed value, reception signals obtained by ultrasonic echoes being received by an ultrasonic element array, and an area of interest is set within the area in which the generated image is to be displayed. When an area of interest is acquired, the reception signals received by the ultrasonic element array are added together with weights that depend on the reception signals, with respect to data forming the basis of the image to be displayed in the area of interest, and image generation is performed.