The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Mar. 04, 2016
Ixia, Calabasas, CA (US);
Jason Marcel Leduc, California, CA (US);
Clifford Tavares, Agoura Hills, CA (US);
Avinash Ramanath, Valencia, CA (US);
Anupkumar Mohanial Jethra, West Hills, CA (US);
Rajanish Jain, Encino, CA (US);
Lewis Ajax Johnson, Delta, CA;
KEYSIGHT TECHNOLOGIES SINGAPORE (HOLDINGS) PTE. LTD., Singapore, SG;
Abstract
The subject matter described herein relates to methods, systems, and computer readable media for adaptive calibration of test systems to interconnects. In some examples, a control circuit performs a method for adaptive calibration including determining, for each configurable calibration parameter of a number of configurable calibration parameters for a receiver for processing a received signal from an interconnect coupled to the receiver, a range of valid values for the configurable calibration parameter. The method further includes for each configurable calibration parameter: sweeping the configurable calibration parameter across a subset of values from the range of valid values for the configurable calibration parameter; and testing the received signal from the interconnect for each value in the subset of values and storing a result of the testing for the value. The method further includes determining a set of calibrated values for the configurable calibration parameters based on the results of the testing.