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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9910088 B1

PDFFull Text
Date of Patent:
Mar. 06, 2018

Filed:

Dec. 22, 2014

Methods and apparatus for sensor diagnostics including programmable self-test signals

Applicant:

Allegro Microsystems, Llc, Worcester, MA (US);

Inventors:

Shaun D. Milano, Dunbarton, NH (US);

Georges El Bacha, Manchester, NH (US);

Michael C. Doogue, Bedford, NH (US);

William P. Taylor, Amherst, NH (US);

Assignee:

ALLEGRO MICROSYSTEMS, LLC, Worcester, MA (US);

Attorney:

Daly, Crowley, Mofford & Durkee, LLP

Primary Examiner:

Arleen M Vazquez

Assistant Examiner:

Neel Shah

Int. Cl.
CPC ...
G01B 7/30 (2006.01); G01R 27/02 (2006.01); G01R 31/02 (2006.01); G01R 31/28 (2006.01); G01R 33/00 (2006.01); G01R 31/3187 (2006.01); G01R 33/02 (2006.01); G01R 33/07 (2006.01); G01R 33/09 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01); G01R 31/2829 (2013.01); G01R 31/3187 (2013.01); G01R 33/00 (2013.01); G01R 33/0023 (2013.01); G01R 33/02 (2013.01); G01R 33/07 (2013.01); G01R 33/09 (2013.01); G01R 33/091 (2013.01); G01R 35/00 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48247 (2013.01); H01L 2224/48257 (2013.01); H01L 2924/181 (2013.01);
Abstract

Methods and apparatus to provide an integrated circuit having a magnetic sensing element and fault detection module coupled to the sensing element, the fault detection module including circuitry to detect a fault condition and to self-test operation of the circuitry for detecting the fault condition. In illustrative embodiments, a fault pin indicates the fault condition.

Find Patent Forward Citations

Milano, Shaun. (2018). Methods and apparatus for sensor diagnostics including programmable self-test signals (U.S. Patent No. 9910088). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9910088

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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