The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Sep. 03, 2014
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Vishnu Vardhan Krishnamachari, Seeheim-Jugenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The invention relates to a method for investigating a sample, the sample being impinged upon by illuminating light, and detected light emerging from the sample being directed to a detector, and the illuminating light being directed through an acousto-optic component with which the impingement upon the sample by illuminating light can be temporarily interrupted. The method is notable for the fact that the sample is illuminated with a first illuminating light bundle that has a first linear polarization direction, and with a second illuminating light bundle whose linear polarization direction is continuously switched over between the first linear polarization direction and a second linear polarization direction different from the first linear polarization direction, the illuminating light having the first linear polarization direction proceeding along a first light path and illuminating light having the second linear polarization direction proceeding along a second light path, and the acousto-optic component combining the light paths.