The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Feb. 19, 2016
Applicant:

Iris International, Inc., Chatsworth, CA (US);

Inventors:

Bart J. Wanders, Trabuco Canyon, CA (US);

Thomas H. Adams, Encinitas, CA (US);

Gregory A. Farrell, Ridgewood, NJ (US);

Warren Groner, Somers, NY (US);

Xiaodong Zhao, San Diego, CA (US);

Assignee:

Iris International, Inc., Chatsworth, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 31/00 (2006.01); G01N 15/14 (2006.01); G01N 33/50 (2006.01); G01N 33/80 (2006.01); G01N 1/30 (2006.01); G01N 21/53 (2006.01); G01N 33/49 (2006.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01); G01N 21/05 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1404 (2013.01); G01N 1/30 (2013.01); G01N 15/147 (2013.01); G01N 15/1434 (2013.01); G01N 15/1463 (2013.01); G01N 15/1468 (2013.01); G01N 15/1475 (2013.01); G01N 21/53 (2013.01); G01N 33/49 (2013.01); G01N 33/4915 (2013.01); G01N 33/5091 (2013.01); G01N 33/5094 (2013.01); G01N 33/80 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1037 (2013.01); G01N 2015/1411 (2013.01); G01N 2015/1413 (2013.01); G01N 2015/1452 (2013.01); G01N 2015/1486 (2013.01); G01N 2021/058 (2013.01);
Abstract

The present disclosure relates to apparatus, systems, compositions, and methods for analyzing a sample containing particles. In some aspects the system comprises an analyzer which may be a visual analyzer. In one aspect, this disclosure relates to a particle imaging system comprising a flowcell through which a sample containing particles is caused to flow, and a high optical resolution imaging device which captures images for image analysis of samples. Other compositions, methods and features of this disclosure are disclosed herein.


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