The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Feb. 08, 2016
Jan J. Tatarkiewicz, San Diego, CA (US);
Jan J. Tatarkiewicz, San Diego, CA (US);
Manta Instruments, Inc., San Diego, CA (US);
Abstract
A system and method are provided to observe and count particles in polydisperse solutions with dark field microscopy while distinguishing among particles of different sizes and accurately counting particles. A calibration mask, calibration light source, and multiple wavelengths of light are used. Opaque calibration marks on the transparent calibration mask define a region of interest. Multiple beams of various wavelengths are combined into a beam or a light sheet and the perpendicular component of scattered light from the specimen particles is then split into separate wavelengths and detected by separate sensors attuned to each wavelength. By calibrating the region of interest and measuring rotational and translational differences between images captured by differing sensors, the images may be aligned exactly and merged, enabling: i) removal of duplicate particles which yields more accurate particle counts, ii) more accurate estimation of the examined volume, and iii) accurate particle concentration measurements.