The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
May. 19, 2016
Topcon Corporation, Tokyo-to, JP;
Kaoru Kumagai, Tokyo-to, JP;
Ken-ichiro Yoshino, Tokyo-to, JP;
TOPCON Corporation, Tokyo-to, JP;
Abstract
The invention provides a surveying instrument, which comprises a horizontal rotating unit and a measuring unit installed on the horizontal rotating unit, wherein the horizontal rotating unit comprises a driving unit for rotating the measuring unit, a horizontal angle detector for measuring horizontal angle data, a first synchronization data generating unit, a first storage unit and a first control unit, the first control unit associates the horizontal angle data with the first synchronization data and stores in the first storage unit, wherein the measuring unit comprises a distance measuring unit for performing a distance measurement, a vertical angle detector for detecting a vertical angle at a time of distance measurement, a second synchronization data generating unit, a second storage unit and a second control unit, the second synchronization data generating unit outputs second synchronization data which indicate timings of a time of acquisition of the distance measurement data and a time of acquisition of the vertical angle data, the second control unit associates the two-dimensional measurement data with the second synchronization data and stores in the second storage unit, and the horizontal angle data and the two-dimensional measurement data can be converted to three-dimensional data based on the first synchronization data and the second synchronization data.