The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Feb. 14, 2013
Applicant:
Terumo Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kenta Sakamoto, Kanagawa, JP;
Assignee:
TERUMO KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61K 35/34 (2015.01); C12Q 1/04 (2006.01); C12N 5/077 (2010.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/04 (2013.01); A61K 35/34 (2013.01); C12N 5/0658 (2013.01); G01N 33/5026 (2013.01); G01N 2800/245 (2013.01);
Abstract
A method and system for evaluating the competence for transplantation of a graft sample containing cells capable of multinucleation are provided. In one form, the method includes determining multinucleating ability as an indicator representing the capacity for multinucleation of the cells capable of multinucleation.
Sakamoto, Kenta. (2018). Method and system for evaluation of grafts (U.S. Patent No. 9909161). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9909161
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile