The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Sep. 29, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Jae Mock Yi, Hwaseong-si, KR;
Dong-Goo Kang, Hwaseong-si, KR;
Young Hun Sung, Hwaseong-si, KR;
Jae Hak Lee, Yongin-si, KR;
Ji Young Choi, Suwon-si, KR;
Seok Min Han, Seongnam-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An X-ray imaging apparatus may include an image acquirer configured to acquire a plurality of X-ray images of an object in different energy bands; and an image processor configured to perform scattering correction on the plurality of X-ray images to remove X-ray scattering from the plurality of X-ray images, perform material separation on the plurality of X-ray images on which the scattering correction has been performed to acquire material information of at least one material included in the object, and repeatedly perform the scattering correction and the material separation depending on whether a predetermined condition is satisfied.