The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2018

Filed:

Nov. 14, 2014
Applicant:

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Thomas Hofmann, Grossenseebach, DE;

Stefan Hebele, Nuremberg, DE;

Thomas Schlechter, Hoechstadt, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/06 (2006.01); H01L 27/146 (2006.01); H01L 27/148 (2006.01); A61B 6/00 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
A61B 6/447 (2013.01); A61B 6/4233 (2013.01); A61B 6/4291 (2013.01); H01L 27/14601 (2013.01); H01L 27/14636 (2013.01); H01L 27/14806 (2013.01); A61B 6/4266 (2013.01); A61B 6/4452 (2013.01); A61B 6/587 (2013.01); A61B 2562/164 (2013.01); G01T 1/243 (2013.01);
Abstract

An X-ray detector has a first detector module, a second detector module and manipulation means. The first detector module includes a first detection region arranged in a first detection plane, the second detector module includes a second detection region arranged in a second detection plane, which is adjacent to the first detection region. The manipulation means is configured to orient the first detection plane of the first detector module and the second detection plane of the second detector module to each other such that a first normal to surface of the first detection plane and a second normal to surface of the second detection plane intersect within a reference region.


Find Patent Forward Citations

Hofmann, Thomas. (2018). X-ray detector and x-ray system (U.S. Patent No. 9907523). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9907523

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…